Semiconductor Characterization Device
Instrument: Keithley 4200-SCS
The device, which is used to determine the current-voltage (I-V) properties of semiconductor materials and electronic devices such as diodes and transistors made from these materials, has real-time graphical presentation with the interface unit working under the windows operating system.
Applications
- Semiconductor circuit elements
- Resistive or capacitive MEMS devices
- Optoelectronic circuit elements
- Materials research
- Electro-chemical researches
Sample Requirements
- Sample connections should be prepared in accordance with existing junction boxes.
- Photosensitive samples should be large enough to fit inside existing boxes; or it should be prepared with light insulation.
Instrument: Keithley 4200-SCS
The device, which is used to determine the current-voltage (I-V) properties of semiconductor materials and electronic devices such as diodes and transistors made from these materials, has real-time graphical presentation with the interface unit working under the windows operating system.
Applications
- Semiconductor circuit elements
- Resistive or capacitive MEMS devices
- Optoelectronic circuit elements
- Materials research
- Electro-chemical researches
Sample Requirements
- Sample connections should be prepared in accordance with existing junction boxes.
- Photosensitive samples should be large enough to fit inside existing boxes; or it should be prepared with light insulation.