Quasistatic C-V Meter
The quasistatic C-V meter measures the quasistatic capacitance of metal-insulator-semiconductor circuit elements (MIS) as a function of applied voltage (C-V). It uses the load-voltage (Q-V) technique during measurement.
Instrument: Keithley 595
This device also has the ability to make current-voltage (I-V) measurements.
Specifications
- Capacitance measuring range (10fF-20nF) and current range (1fA - 20µA)
- ±20V voltage source (0.01V tolerance).
Applications
Quasistatic C-V measurements are used to characterize MIS circuit elements. Combined with high frequency C-V measurements, it enables the detection of interface trap states in MIS diodes.
The quasistatic C-V meter measures the quasistatic capacitance of metal-insulator-semiconductor circuit elements (MIS) as a function of applied voltage (C-V). It uses the load-voltage (Q-V) technique during measurement.
Instrument: Keithley 595
This device also has the ability to make current-voltage (I-V) measurements.
Specifications
- Capacitance measuring range (10fF-20nF) and current range (1fA - 20µA)
- ±20V voltage source (0.01V tolerance).
Applications
Quasistatic C-V measurements are used to characterize MIS circuit elements. Combined with high frequency C-V measurements, it enables the detection of interface trap states in MIS diodes.