Instrument: JXA - 8230

The JXA-8230 Electron Probe Microanalyzer measures the energy and wavelengths of characteristic x-rays by sending a beam of electrons to the sample. It also has the ability to perform qualitative and full quantitative analysis.

Specifications

Element Measurement Range: B(5) to U(92)

Resolution (SEI): 6nm

Magnification : 40x to 300.000x

Acceleration Voltage: 0.2 to 30 kV

Image Mode: SEI (Scanning Electron Microscope)

                         BEI (Backscattered Electron Imaging)

                         OMI (Optical Microscope Image in Reflection and Transmission Mode)

                         XRAY (X-Ray mapping for elements B(5) to U(92))