X-Ray Fluorescence Spectometry
Instrument: Rigaku ZSX Primus II
The X-Ray Fluorescence (XRF) spectrometer in the METU Central Laboratory is one of the important devices used to determine the elemental and chemical composition. Considering that it is fast and sensitive, easy to use, and does not damage the material, its importance in technological and scientific research increases.
If an atom is excited with higher energetic radiation, the higher energy input causes an electron to transfer to a higher energetic shell. While the excited electrons transfer back to their original state, they emit X-rays with an energy of 0,1-50 Å. This secondary X-ray beam is called fluorescence. The radiation wavelengths of each element are different and unique. In other words, these radiations are the fingerprints of each element. By identifying the wavelength of the radiation, the element type (qualitative), and measuring the intensity of each radiation, the concentration (quantitative) of the material can be determined.
Instrument: Rigaku ZSX Primus II
The X-Ray Fluorescence (XRF) spectrometer in the METU Central Laboratory is one of the important devices used to determine the elemental and chemical composition. Considering that it is fast and sensitive, easy to use, and does not damage the material, its importance in technological and scientific research increases.
If an atom is excited with higher energetic radiation, the higher energy input causes an electron to transfer to a higher energetic shell. While the excited electrons transfer back to their original state, they emit X-rays with an energy of 0,1-50 Å. This secondary X-ray beam is called fluorescence. The radiation wavelengths of each element are different and unique. In other words, these radiations are the fingerprints of each element. By identifying the wavelength of the radiation, the element type (qualitative), and measuring the intensity of each radiation, the concentration (quantitative) of the material can be determined.