X-Ray Diffractometry
The X-Ray Diffraction method (XRD) is based on the principle that each crystal refracts X-rays in a characteristic pattern, depending on the phase's unique atomic arrangement. These diffraction profiles for each crystal phase define that crystal, somewhat like a fingerprint. X-Ray Diffraction analysis method does not destroy the sample during analysis and allows analysis of even very small samples. Qualitative and quantitative investigations of rocks, crystalline materials, thin films and polymers can be made with the X-Ray Diffraction device.
Device: Rigaku MiniFlex Desktop X-Ray Diffraction Device
The Rigaku MiniFlex Tabletop Beam Diffractometer features an 8-position automatic sample changer with a 600 W X-ray source. Thanks to its high-speed detector (D/teX Ultra, 1D), it can receive low-noise data in a short time. A copper-targeted X-ray tube is used.
Instrument: Rigaku Ultima-IV X-Ray Diffraction Device
The Rigaku Ultima IV X-Ray Diffractometer, located in the METU Central Laboratory, serves with its multi-purpose units. The device has a copper-targeted X-ray tube and a water cooler that controls sudden temperature changes in the tube. A high resolution Graphite Monochromator is used in the device, which enables monochromatized X-rays to be obtained. The cross beam optical mechanism (CBO) in the Ultima IV XRD device provides the opportunity to work in focus or parallel beam geometry without any new adjustments and adjustments. Although very strong diffraction bands were obtained from well-crystallized and smooth-surfaced samples by the routinely used "Bragg-Brentano focal beam geometry" method; "Parallel focal beam geometry" is used for phase definitions of rough surface, weakly crystallized samples and especially thin films. In addition, although a weak signal is usually obtained from thin films of different thicknesses with the standard Θ/2Θ scanning method (in the range of 2Θ=2-90°), a stronger signal is obtained with the 2Θ scanning method and a fixed grazing angle (GIXD-minimum 0.1°). signal can be obtained. With this technique, very sensitive measurements can be made on thin film and polycrystalline samples.
Sample Requirements
Powder samples: Samples to be analyzed should be delivered to the Central Laboratory in finely ground powder form. Sufficient information should be given about the samples subjected to different physical and chemical treatments. The amount of sample to be delivered to the laboratory in powder form is approximately 10 gr. for rock samples; for samples synthesized in the laboratory and which cannot be obtained in large quantities, at least 100-150 mgr. should be.
Thin Films: Thin film samples to be sent to the Central Laboratory should be prepared with a minimum size of 1x1 cm and 7 mm. It should not be thicker than
Thin film measurements are made in the last week of each month; The measurement program may change according to the sample demand situation.
Applications
The Rigaku Ultima IV X-Ray Diffraction device has a wide range of applications
- Identifying minerals and rocks in geology
- In metal and alloy analysis
- In the ceramic and cement industry
- In the determination of thin film composition
- In the analysis of polymers
- Detection of polymorphs and impurities in a certain material in the pharmaceutical industry
- In archeology, in the determination of the materials that make up the historical buildings
The X-Ray Diffraction method (XRD) is based on the principle that each crystal refracts X-rays in a characteristic pattern, depending on the phase's unique atomic arrangement. These diffraction profiles for each crystal phase define that crystal, somewhat like a fingerprint. X-Ray Diffraction analysis method does not destroy the sample during analysis and allows analysis of even very small samples. Qualitative and quantitative investigations of rocks, crystalline materials, thin films and polymers can be made with the X-Ray Diffraction device.
Device: Rigaku MiniFlex Desktop X-Ray Diffraction Device
The Rigaku MiniFlex Tabletop Beam Diffractometer features an 8-position automatic sample changer with a 600 W X-ray source. Thanks to its high-speed detector (D/teX Ultra, 1D), it can receive low-noise data in a short time. A copper-targeted X-ray tube is used.
Instrument: Rigaku Ultima-IV X-Ray Diffraction Device
The Rigaku Ultima IV X-Ray Diffractometer, located in the METU Central Laboratory, serves with its multi-purpose units. The device has a copper-targeted X-ray tube and a water cooler that controls sudden temperature changes in the tube. A high resolution Graphite Monochromator is used in the device, which enables monochromatized X-rays to be obtained. The cross beam optical mechanism (CBO) in the Ultima IV XRD device provides the opportunity to work in focus or parallel beam geometry without any new adjustments and adjustments. Although very strong diffraction bands were obtained from well-crystallized and smooth-surfaced samples by the routinely used "Bragg-Brentano focal beam geometry" method; "Parallel focal beam geometry" is used for phase definitions of rough surface, weakly crystallized samples and especially thin films. In addition, although a weak signal is usually obtained from thin films of different thicknesses with the standard Θ/2Θ scanning method (in the range of 2Θ=2-90°), a stronger signal is obtained with the 2Θ scanning method and a fixed grazing angle (GIXD-minimum 0.1°). signal can be obtained. With this technique, very sensitive measurements can be made on thin film and polycrystalline samples.
Sample Requirements
Powder samples: Samples to be analyzed should be delivered to the Central Laboratory in finely ground powder form. Sufficient information should be given about the samples subjected to different physical and chemical treatments. The amount of sample to be delivered to the laboratory in powder form is approximately 10 gr. for rock samples; for samples synthesized in the laboratory and which cannot be obtained in large quantities, at least 100-150 mgr. should be.
Thin Films: Thin film samples to be sent to the Central Laboratory should be prepared with a minimum size of 1x1 cm and 7 mm. It should not be thicker than
Thin film measurements are made in the last week of each month; The measurement program may change according to the sample demand situation.
Applications
The Rigaku Ultima IV X-Ray Diffraction device has a wide range of applications
- Identifying minerals and rocks in geology
- In metal and alloy analysis
- In the ceramic and cement industry
- In the determination of thin film composition
- In the analysis of polymers
- Detection of polymorphs and impurities in a certain material in the pharmaceutical industry
- In archeology, in the determination of the materials that make up the historical buildings