Surface Analysis Laboratory (YAL)

	X-ray photoelectron spectroscopy (X-ray photoelectron spectroscopy, XPS) and Time of Flight Secondary Ion Mass Spectroscopy (ToF-SIMS) methods are used to determine the elemental and molecular components of the surfaces and interfaces of materials.
Flyer

mlabyalmetu [dot] edu [dot] tr

Uzman	e-posta
Lecturer PhD. İlker Yıldız Laboratuvar Sorumlusu	mlabyalmetu [dot] edu [dot] tr
Lecturer PhD. Canan Özkan	mlabyalmetu [dot] edu [dot] tr
Research Assistant PhD. Seçkin Öztürk	mlabyalmetu [dot] edu [dot] tr

We do not have a decision rule and no declaration of conformity is given.

Depending on the Applicant Institution Following Discount Rates can be Applied.

METU	%65
Universities other than METU (Public, Foundation)	%40
METU Technopark	%30
Public institutions and organizations	%20
Technoparks at Other Universities	%15
Public University and private sector cooperation (If the application is made through the University Channel)	%20

METU Central Laboratory reserves the right to change the Fees and/or Price System without prior notice.

20% VAT is not included in the Analysis Fees. There is no university or institution discount in the analysis fee for individual applications made by university or institution personnel who are not faculty members or project coordinators.

For test requests, multiple samples and research test requests that are not specified in the test list, the service fees are separately determined by the MERLAB Senior Management.

METU Central Laboratory reserves the right to change the Fees and/or Remuneration System without prior notice.

Method/Analysis Name	Service Description	Fee	Analysis Request Form
TOF-SIMS	TOF-SIMS Analysis	6000/Hour	Form
TOF-SIMS	Imaging	7000/Sample	Form
XPS	General Scan	2500/Sample	Maintenance
	Partial Scan	3000/Sample
	Imaging	4000/Sample
	UV-XPS	4000/Sample
Derinlik Profili (XPS)	2 Layers	4430	Maintenance
	3 Layers	4560
	4 Layers	5370
	5 Layers	6135
	6 Layers	6945
	7 Layers	7625
	8 Layers	8220
	9 Layers	8860
	10 Layers	9500
	11 Layers	10055
	12 Layers	10565
	13 Layers	11030
	14 Layers	11585
	15 Layers	12140
	16 Layers	12610
	17 Layers	13160
	18 Layers	13590
	19 Layers	14055
	20 Layers	14480
	21 Layers	14955
	22 Layers	15380
	23 Layers	15890
	24 Layers	16230
	25 Layers	16655
	26 Layers	17035
	27 Layers	17465
Açı sayısına göre	1 adet	2195	Maintenance
	2 adet	3115
	3 adet	3870
	4 adet	4590
	5 adet	5275
	6 adet	5900
	7 adet	6490
	8 adet	7080
	9 adet	7665
	10 adet	8225
	11 adet	8780
	12 adet	9340
	13 adet	9830
	14 adet	10355
	15 adet	10845
	16 adet	11305
	17 adet	11830
	18 adet	12285
	19 adet	12780
	20 adet	13240

	X-ray photoelectron spectroscopy (X-ray photoelectron spectroscopy, XPS) and Time of Flight Secondary Ion Mass Spectroscopy (ToF-SIMS) methods are used to determine the elemental and molecular components of the surfaces and interfaces of materials.
Flyer

mlabyalmetu [dot] edu [dot] tr

Uzman	e-posta
Lecturer PhD. İlker Yıldız Laboratuvar Sorumlusu	mlabyalmetu [dot] edu [dot] tr
Lecturer PhD. Canan Özkan	mlabyalmetu [dot] edu [dot] tr
Research Assistant PhD. Seçkin Öztürk	mlabyalmetu [dot] edu [dot] tr

We do not have a decision rule and no declaration of conformity is given.

Depending on the Applicant Institution Following Discount Rates can be Applied.

METU	%65
Universities other than METU (Public, Foundation)	%40
METU Technopark	%30
Public institutions and organizations	%20
Technoparks at Other Universities	%15
Public University and private sector cooperation (If the application is made through the University Channel)	%20

METU Central Laboratory reserves the right to change the Fees and/or Price System without prior notice.

20% VAT is not included in the Analysis Fees. There is no university or institution discount in the analysis fee for individual applications made by university or institution personnel who are not faculty members or project coordinators.

For test requests, multiple samples and research test requests that are not specified in the test list, the service fees are separately determined by the MERLAB Senior Management.

METU Central Laboratory reserves the right to change the Fees and/or Remuneration System without prior notice.

Method/Analysis Name	Service Description	Fee	Analysis Request Form
TOF-SIMS	TOF-SIMS Analysis	6000/Hour	Form
TOF-SIMS	Imaging	7000/Sample	Form
XPS	General Scan	2500/Sample	Maintenance
	Partial Scan	3000/Sample
	Imaging	4000/Sample
	UV-XPS	4000/Sample
Derinlik Profili (XPS)	2 Layers	4430	Maintenance
	3 Layers	4560
	4 Layers	5370
	5 Layers	6135
	6 Layers	6945
	7 Layers	7625
	8 Layers	8220
	9 Layers	8860
	10 Layers	9500
	11 Layers	10055
	12 Layers	10565
	13 Layers	11030
	14 Layers	11585
	15 Layers	12140
	16 Layers	12610
	17 Layers	13160
	18 Layers	13590
	19 Layers	14055
	20 Layers	14480
	21 Layers	14955
	22 Layers	15380
	23 Layers	15890
	24 Layers	16230
	25 Layers	16655
	26 Layers	17035
	27 Layers	17465
Açı sayısına göre	1 adet	2195	Maintenance
	2 adet	3115
	3 adet	3870
	4 adet	4590
	5 adet	5275
	6 adet	5900
	7 adet	6490
	8 adet	7080
	9 adet	7665
	10 adet	8225
	11 adet	8780
	12 adet	9340
	13 adet	9830
	14 adet	10355
	15 adet	10845
	16 adet	11305
	17 adet	11830
	18 adet	12285
	19 adet	12780
	20 adet	13240