High Contrast TEM, (CTEM):

CTEM is designed to obtain maximum contrast from low contrast samples by means of special lens configuration. Operation of CTEM with a fast transition of accelerating voltages between 20 kV to 120 kV is an ideal feature to reduce electron beam damage in biological and polymeric samples. Bright field, dark field and selected area diffraction imaging modes can be used. In addition, with the help of tomography option images taken from sample with different tilt angles are combined by Xplore 3D programme and three dimensional images of samples can be obtained.

Technical Specifications of FEI Tecnai G2 Spirit BioTwin CTEM

Accelerating voltage: 20-120 kV

Voltage stability: ≤ 2 ppm/min

Electron Source: LaB₆

Filament lifetime: > 1 year

Line resolution: 0.34 nm

Magnification: 22 x – 340 000 x

SA Camera Length: 0.05 – 8.9 m

Number of spot size: 11

Number of C1 apertures: 1 fixed

Number of C2 apertures: 4 exchangeable

Number of obj. apertures: 4 exchangeable

Focal length: 6.1 mm

Information limit: < 0.20 nm

Max. alfa tilt angle: ± 80°

Specimen drift: ≤ 1.0 nm/min