ON-DEMAND RE-ANALYSIS WILL NOT BE PERFORMED IN MERCURY POROSIMETER ANALYSES.

Mercury porosimetry operate on the physical principle that an inert, non-wetting liquid cannot enter small pores unless adequate pressure is applied. The relationship between the applied pressure and the pore diameter is obtained by the Washburn equation:

D=(-4γ cosθ)/P

XPS : X-Ray photoelectron Spectroscopy or Electron spectroscopy for chemical analysis (ESCA) is an advanced surface analysis technique used to obtain chemical information about the surfaces of solid materials. The method uses an x-ray beam that excites solid samples to scatter photoelectrons.

Instrument:  ION-TOF ToF-SIMS 5

Secondary ion mass spectroscopy (SIMS) is a very sensitive surface analytical technique that provides elemental and molecular information about solid surfaces by blasting samples with a focused primary ion beam with a few keV energy and analyzing the secondary ions emitted from the surface of the samples. Secondary ions emitted from the surface are analyzed by time-of-flight mass spectrometry.

The different types of analysis described below can be applied.

Surface Spectroscopy

Atomic masses are too small to be measured with any weighing device used in daily life. For this reason, when talking about atomic masses, relative masses according to a standard are used instead of grams. This standard is called the atomic mass unit (akb, Da) and is represented by 1 in 12 the mass of the carbon-12 atom.

The X-Ray Diffraction method (XRD) is based on the principle that each crystal refracts X-rays in a characteristic pattern, depending on the phase's unique atomic arrangement. These diffraction profiles for each crystal phase define that crystal, somewhat like a fingerprint. X-Ray Diffraction analysis method does not destroy the sample during analysis and allows analysis of even very small samples.

High Contrast TEM, (CTEM):