X-Ray Diffraction Laboratory (XRDL)

	By detecting the X-rays refracted from the materials, the structure of the target crystal can be understood. The X-ray diffraction device used in the analysis can be operated in either focal or parallel beam geometry. In addition, measurements can be taken at the swept angle position in thin film and polycrystalline samples.
Flyer

mlabxrdlmetu [dot] edu [dot] tr

03122106437

Uzman	e-posta
Lecturer Ali Güzel Laboratuvar Sorumlusu	mlabxrdlmetu [dot] edu [dot] tr
Lecturer Pelin Paşabeyoğlu	mlabxrdlmetu [dot] edu [dot] tr

We do not have a decision rule and no declaration of conformity is given.

Depending on the Applicant Institution Following Discount Rates can be Applied.

METU	%65
Universities other than METU (Public, Foundation)	%40
METU Technopark	%30
Public institutions and organizations	%20
Technoparks at Other Universities	%15
Public University and private sector cooperation (If the application is made through the University Channel)	%20

METU Central Laboratory reserves the right to change the Fees and/or Price System without prior notice.

20% VAT is not included in the Analysis Fees. There is no university or institution discount in the analysis fee for individual applications made by university or institution personnel who are not faculty members or project coordinators.

For test requests, multiple samples and research test requests that are not specified in the test list, the service fees are separately determined by the MERLAB Senior Management.

METU Central Laboratory reserves the right to change the Fees and/or Remuneration System without prior notice.

Method/Analysis Name	Service Description	Fee	Analysis Request Form
XRD	Powder Diffraction Pattern Standard Shot	500₺/Numune	Form
	Powder Diffraction Pattern Low Angle Shooting (Up to 1 Hour)	500₺/Numune
	Thin Film¹ Diffraction Pattern Capture (Up to 1 Hour)	500₺/Numune
	For every additional hour	150₺
¹Device adjustments (approximately 15min/sample) and time taken for trial measurements will be charged for thin film measurements.

	By detecting the X-rays refracted from the materials, the structure of the target crystal can be understood. The X-ray diffraction device used in the analysis can be operated in either focal or parallel beam geometry. In addition, measurements can be taken at the swept angle position in thin film and polycrystalline samples.
Flyer

mlabxrdlmetu [dot] edu [dot] tr

03122106437

Uzman	e-posta
Lecturer Ali Güzel Laboratuvar Sorumlusu	mlabxrdlmetu [dot] edu [dot] tr
Lecturer Pelin Paşabeyoğlu	mlabxrdlmetu [dot] edu [dot] tr

We do not have a decision rule and no declaration of conformity is given.

Depending on the Applicant Institution Following Discount Rates can be Applied.

METU	%65
Universities other than METU (Public, Foundation)	%40
METU Technopark	%30
Public institutions and organizations	%20
Technoparks at Other Universities	%15
Public University and private sector cooperation (If the application is made through the University Channel)	%20

METU Central Laboratory reserves the right to change the Fees and/or Price System without prior notice.

20% VAT is not included in the Analysis Fees. There is no university or institution discount in the analysis fee for individual applications made by university or institution personnel who are not faculty members or project coordinators.

For test requests, multiple samples and research test requests that are not specified in the test list, the service fees are separately determined by the MERLAB Senior Management.

METU Central Laboratory reserves the right to change the Fees and/or Remuneration System without prior notice.

Method/Analysis Name	Service Description	Fee	Analysis Request Form
XRD	Powder Diffraction Pattern Standard Shot	500₺/Numune	Form
	Powder Diffraction Pattern Low Angle Shooting (Up to 1 Hour)	500₺/Numune
	Thin Film¹ Diffraction Pattern Capture (Up to 1 Hour)	500₺/Numune
	For every additional hour	150₺
¹Device adjustments (approximately 15min/sample) and time taken for trial measurements will be charged for thin film measurements.