Surface Analysis Laboratory (YAL)
![]() |
X-ray photoelectron spectroscopy (X-ray photoelectron spectroscopy, XPS) and Time of Flight Secondary Ion Mass Spectroscopy (ToF-SIMS) methods are used to determine the elemental and molecular components of the surfaces and interfaces of materials. |
Flyer |
Contact
mlabyalmetu [dot] edu [dot] tr
Laboratory email address is our preferred way of communication. Incoming calls during analysis cause difficulties during analysis. Please ask your questions via email.
Staff
Uzman | e-posta |
---|---|
Lecturer PhD. İlker Yıldız Laboratuvar Sorumlusu |
mlabyal |
Lecturer PhD. Canan Özkan |
mlabyal |
Research Assistant PhD. Seçkin Öztürk |
mlabyal |
Service Fees
We do not have a decision rule and no declaration of conformity is given.
Depending on the Applicant Institution Following Discount Rates can be Applied. |
|
METU | %65 |
Universities other than METU (Public, Foundation) | %40 |
METU Technopark | %30 |
Public institutions and organizations | %20 |
Technoparks at Other Universities | %15 |
Public University and private sector cooperation (If the application is made through the University Channel) |
%20 |
|
|
METU Central Laboratory reserves the right to change the |
|
20% VAT is not included in the Analysis Fees. There is no university or institution discount in the analysis fee for individual applications made by |
|
For test requests, multiple samples and research test requests that are not specified in the test list, |
METU Central Laboratory reserves the right to change the Fees and/or Remuneration System without prior notice.
Method/Analysis Name | Service Description | Fee | Analysis Request Form |
---|---|---|---|
TOF-SIMS | TOF-SIMS Analysis | 6000/Hour | Out Of Order |
Imaging | 7000/Sample | ||
XPS | General Scan | 2000/Sample | Form |
Partial Scan | 2400/Sample | ||
Imaging | 4000/Sample | ||
UV-XPS | 4000/Sample | ||
Derinlik Profili (XPS) | 2 Layers | 3542 | Form |
3 Layers | 3646 | ||
4 Layers | 4294 | ||
5 Layers | 4906 | ||
6 Layers | 5554 | ||
7 Layers | 6098 | ||
8 Layers | 6576 | ||
9 Layers | 7087 | ||
10 Layers | 7598 | ||
11 Layers | 8042 | ||
12 Layers | 8450 | ||
13 Layers | 8823 | ||
14 Layers | 9267 | ||
15 Layers | 9710 | ||
16 Layers | 10086 | ||
17 Layers | 10527 | ||
18 Layers | 10868 | ||
19 Layers | 11243 | ||
20 Layers | 11584 | ||
21 Layers | 11960 | ||
22 Layers | 12300 | ||
23 Layers | 12709 | ||
24 Layers | 12982 | ||
25 Layers | 13322 | ||
26 Layers | 13628 | ||
27 Layers | 13969 | ||
Açı sayısına göre | 1 adet | 1756 | Form |
2 adet | 2489 | ||
3 adet | 3093 | ||
4 adet | 3669 | ||
5 adet | 4220 | ||
6 adet | 4718 | ||
7 adet | 5190 | ||
8 adet | 5662 | ||
9 adet | 6132 | ||
10 adet | 6579 | ||
11 adet | 7024 | ||
12 adet | 7469 | ||
13 adet | 7862 | ||
14 adet | 8282 | ||
15 adet | 8674 | ||
16 adet | 9041 | ||
17 adet | 9461 | ||
18 adet | 9828 | ||
19 adet | 10221 | ||
20 adet | 10588 |
![]() |
X-ray photoelectron spectroscopy (X-ray photoelectron spectroscopy, XPS) and Time of Flight Secondary Ion Mass Spectroscopy (ToF-SIMS) methods are used to determine the elemental and molecular components of the surfaces and interfaces of materials. |
Flyer |
Contact
mlabyalmetu [dot] edu [dot] tr
Laboratory email address is our preferred way of communication. Incoming calls during analysis cause difficulties during analysis. Please ask your questions via email.
Staff
Uzman | e-posta |
---|---|
Lecturer PhD. İlker Yıldız Laboratuvar Sorumlusu |
mlabyal |
Lecturer PhD. Canan Özkan |
mlabyal |
Research Assistant PhD. Seçkin Öztürk |
mlabyal |
Service Fees
We do not have a decision rule and no declaration of conformity is given.
Depending on the Applicant Institution Following Discount Rates can be Applied. |
|
METU | %65 |
Universities other than METU (Public, Foundation) | %40 |
METU Technopark | %30 |
Public institutions and organizations | %20 |
Technoparks at Other Universities | %15 |
Public University and private sector cooperation (If the application is made through the University Channel) |
%20 |
|
|
METU Central Laboratory reserves the right to change the |
|
20% VAT is not included in the Analysis Fees. There is no university or institution discount in the analysis fee for individual applications made by |
|
For test requests, multiple samples and research test requests that are not specified in the test list, |
METU Central Laboratory reserves the right to change the Fees and/or Remuneration System without prior notice.
Method/Analysis Name | Service Description | Fee | Analysis Request Form |
---|---|---|---|
TOF-SIMS | TOF-SIMS Analysis | 6000/Hour | Out Of Order |
Imaging | 7000/Sample | ||
XPS | General Scan | 2000/Sample | Form |
Partial Scan | 2400/Sample | ||
Imaging | 4000/Sample | ||
UV-XPS | 4000/Sample | ||
Derinlik Profili (XPS) | 2 Layers | 3542 | Form |
3 Layers | 3646 | ||
4 Layers | 4294 | ||
5 Layers | 4906 | ||
6 Layers | 5554 | ||
7 Layers | 6098 | ||
8 Layers | 6576 | ||
9 Layers | 7087 | ||
10 Layers | 7598 | ||
11 Layers | 8042 | ||
12 Layers | 8450 | ||
13 Layers | 8823 | ||
14 Layers | 9267 | ||
15 Layers | 9710 | ||
16 Layers | 10086 | ||
17 Layers | 10527 | ||
18 Layers | 10868 | ||
19 Layers | 11243 | ||
20 Layers | 11584 | ||
21 Layers | 11960 | ||
22 Layers | 12300 | ||
23 Layers | 12709 | ||
24 Layers | 12982 | ||
25 Layers | 13322 | ||
26 Layers | 13628 | ||
27 Layers | 13969 | ||
Açı sayısına göre | 1 adet | 1756 | Form |
2 adet | 2489 | ||
3 adet | 3093 | ||
4 adet | 3669 | ||
5 adet | 4220 | ||
6 adet | 4718 | ||
7 adet | 5190 | ||
8 adet | 5662 | ||
9 adet | 6132 | ||
10 adet | 6579 | ||
11 adet | 7024 | ||
12 adet | 7469 | ||
13 adet | 7862 | ||
14 adet | 8282 | ||
15 adet | 8674 | ||
16 adet | 9041 | ||
17 adet | 9461 | ||
18 adet | 9828 | ||
19 adet | 10221 | ||
20 adet | 10588 |