Surface Analysis Laboratory (YAL)

	X-ray photoelectron spectroscopy (X-ray photoelectron spectroscopy, XPS) and Time of Flight Secondary Ion Mass Spectroscopy (ToF-SIMS) methods are used to determine the elemental and molecular components of the surfaces and interfaces of materials.
Flyer

mlabyalmetu [dot] edu [dot] tr

Uzman	e-posta
Lecturer PhD. İlker Yıldız Laboratuvar Sorumlusu	mlabyalmetu [dot] edu [dot] tr
Lecturer PhD. Canan Özkan	mlabyalmetu [dot] edu [dot] tr
Research Assistant PhD. Seçkin Öztürk	mlabyalmetu [dot] edu [dot] tr

We do not have a decision rule and no declaration of conformity is given.

Depending on the Applicant Institution Following Discount Rates can be Applied.

METU	%65
Universities other than METU (Public, Foundation)	%40
METU Technopark	%30
Public institutions and organizations	%20
Technoparks at Other Universities	%15
Public University and private sector cooperation (If the application is made through the University Channel)	%20

METU Central Laboratory reserves the right to change the Fees and/or Price System without prior notice.

20% VAT is not included in the Analysis Fees. There is no university or institution discount in the analysis fee for individual applications made by university or institution personnel who are not faculty members or project coordinators.

For test requests, multiple samples and research test requests that are not specified in the test list, the service fees are separately determined by the MERLAB Senior Management.

METU Central Laboratory reserves the right to change the Fees and/or Remuneration System without prior notice.

Method/Analysis Name	Service Description	Fee	Analysis Request Form
TOF-SIMS	TOF-SIMS Analysis	6000/Hour	Form
TOF-SIMS	Imaging	7000/Sample	Form
XPS	General Scan	2000/Sample	Out of order
	Partial Scan	2400/Sample
	Imaging	4000/Sample
	UV-XPS	4000/Sample
Derinlik Profili (XPS)	2 Layers	3542	Out of order
	3 Layers	3646
	4 Layers	4294
	5 Layers	4906
	6 Layers	5554
	7 Layers	6098
	8 Layers	6576
	9 Layers	7087
	10 Layers	7598
	11 Layers	8042
	12 Layers	8450
	13 Layers	8823
	14 Layers	9267
	15 Layers	9710
	16 Layers	10086
	17 Layers	10527
	18 Layers	10868
	19 Layers	11243
	20 Layers	11584
	21 Layers	11960
	22 Layers	12300
	23 Layers	12709
	24 Layers	12982
	25 Layers	13322
	26 Layers	13628
	27 Layers	13969
Açı sayısına göre	1 adet	1756	Out of order
	2 adet	2489
	3 adet	3093
	4 adet	3669
	5 adet	4220
	6 adet	4718
	7 adet	5190
	8 adet	5662
	9 adet	6132
	10 adet	6579
	11 adet	7024
	12 adet	7469
	13 adet	7862
	14 adet	8282
	15 adet	8674
	16 adet	9041
	17 adet	9461
	18 adet	9828
	19 adet	10221
	20 adet	10588

	X-ray photoelectron spectroscopy (X-ray photoelectron spectroscopy, XPS) and Time of Flight Secondary Ion Mass Spectroscopy (ToF-SIMS) methods are used to determine the elemental and molecular components of the surfaces and interfaces of materials.
Flyer

mlabyalmetu [dot] edu [dot] tr

Uzman	e-posta
Lecturer PhD. İlker Yıldız Laboratuvar Sorumlusu	mlabyalmetu [dot] edu [dot] tr
Lecturer PhD. Canan Özkan	mlabyalmetu [dot] edu [dot] tr
Research Assistant PhD. Seçkin Öztürk	mlabyalmetu [dot] edu [dot] tr

We do not have a decision rule and no declaration of conformity is given.

Depending on the Applicant Institution Following Discount Rates can be Applied.

METU	%65
Universities other than METU (Public, Foundation)	%40
METU Technopark	%30
Public institutions and organizations	%20
Technoparks at Other Universities	%15
Public University and private sector cooperation (If the application is made through the University Channel)	%20

METU Central Laboratory reserves the right to change the Fees and/or Price System without prior notice.

20% VAT is not included in the Analysis Fees. There is no university or institution discount in the analysis fee for individual applications made by university or institution personnel who are not faculty members or project coordinators.

For test requests, multiple samples and research test requests that are not specified in the test list, the service fees are separately determined by the MERLAB Senior Management.

METU Central Laboratory reserves the right to change the Fees and/or Remuneration System without prior notice.

Method/Analysis Name	Service Description	Fee	Analysis Request Form
TOF-SIMS	TOF-SIMS Analysis	6000/Hour	Form
TOF-SIMS	Imaging	7000/Sample	Form
XPS	General Scan	2000/Sample	Out of order
	Partial Scan	2400/Sample
	Imaging	4000/Sample
	UV-XPS	4000/Sample
Derinlik Profili (XPS)	2 Layers	3542	Out of order
	3 Layers	3646
	4 Layers	4294
	5 Layers	4906
	6 Layers	5554
	7 Layers	6098
	8 Layers	6576
	9 Layers	7087
	10 Layers	7598
	11 Layers	8042
	12 Layers	8450
	13 Layers	8823
	14 Layers	9267
	15 Layers	9710
	16 Layers	10086
	17 Layers	10527
	18 Layers	10868
	19 Layers	11243
	20 Layers	11584
	21 Layers	11960
	22 Layers	12300
	23 Layers	12709
	24 Layers	12982
	25 Layers	13322
	26 Layers	13628
	27 Layers	13969
Açı sayısına göre	1 adet	1756	Out of order
	2 adet	2489
	3 adet	3093
	4 adet	3669
	5 adet	4220
	6 adet	4718
	7 adet	5190
	8 adet	5662
	9 adet	6132
	10 adet	6579
	11 adet	7024
	12 adet	7469
	13 adet	7862
	14 adet	8282
	15 adet	8674
	16 adet	9041
	17 adet	9461
	18 adet	9828
	19 adet	10221
	20 adet	10588