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X-Ray Fluorescence Spectometry

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Instrument: Rigaku ZSX Primus II

The X-Ray Fluorescence (XRF) spectrometer in the METU Central Laboratory is one of the important devices used to determine the elemental and chemical composition. Considering that it is fast and sensitive, easy to use, and does not damage the material, its importance in technological and scientific research increases.

If an atom is excited with higher energetic radiation, the higher energy input causes an electron to transfer to a higher energetic shell. While the excited electrons transfer back to their original state, they emit X-rays with an energy of 0,1-50 Å. This secondary X-ray beam is called fluorescence. The radiation wavelengths of each element are different and unique. In other words, these radiations are the fingerprints of each element. By identifying the wavelength of the radiation, the element type (qualitative), and measuring the intensity of each radiation, the concentration (quantitative) of the material can be determined.

R&D Training and Measurement Center

Chemical Analysis Laboratory (KAL)

Atomic Absorption Spectrometer
Inductively Coupled Plasma Mass Spectrometer
Inductively Coupled Plasma Optical Emission Spectrometer
Sample Preperation
UV-VIS Spectrophotometer
X-Ray Fluorescence Spectometry


Laboratories

R&D Training and Measurement Center

Chemical Analysis Laboratory (KAL)

Atomic Absorption Spectrometer
Inductively Coupled Plasma Mass Spectrometer
Inductively Coupled Plasma Optical Emission Spectrometer
Sample Preperation
UV-VIS Spectrophotometer
X-Ray Fluorescence Spectometry


Laboratories

Share
Tweet
  • English
  • Türkçe
Listen

Instrument: Rigaku ZSX Primus II

The X-Ray Fluorescence (XRF) spectrometer in the METU Central Laboratory is one of the important devices used to determine the elemental and chemical composition. Considering that it is fast and sensitive, easy to use, and does not damage the material, its importance in technological and scientific research increases.

If an atom is excited with higher energetic radiation, the higher energy input causes an electron to transfer to a higher energetic shell. While the excited electrons transfer back to their original state, they emit X-rays with an energy of 0,1-50 Å. This secondary X-ray beam is called fluorescence. The radiation wavelengths of each element are different and unique. In other words, these radiations are the fingerprints of each element. By identifying the wavelength of the radiation, the element type (qualitative), and measuring the intensity of each radiation, the concentration (quantitative) of the material can be determined.

Merkezi Laboratuvar ARGE Eğitim Ölçme Merkezi Üniversiteler Mahallesi, Dumlupınar Bulvarı No:1, 06800 Çankaya/Ankara © ORTA DOĞU TEKNİK ÜNİVERSİTESİ ANKARA KAMPUSU