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Semiconductor Characterization Device

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Instrument:
 Keithley 4200-SCS

The device, which is used to determine the current-voltage (I-V) properties of semiconductor materials and electronic devices such as diodes and transistors made from these materials, has real-time graphical presentation with the interface unit working under the windows operating system.

Applications

  • Semiconductor circuit elements
  • Resistive or capacitive MEMS devices
  • Optoelectronic circuit elements
  • Materials research
  • Electro-chemical researches

Sample Requirements

  • Sample connections should be prepared in accordance with existing junction boxes.
  • Photosensitive samples should be large enough to fit inside existing boxes; or it should be prepared with light insulation.

R&D Training and Measurement Center

Electrical, Magnetic and Optical Properties Measurement Laboratory(EMOL)

Atomic Force Microscope
Barkhausen-Noise Analysis System
Color Spectrophotometer
Digital Multimeters
Electrical and Magnetic Properties Measurement System
Impedance Analyzer
Nanovolt, Micro-Ohm Meter
Oscilloscope
Quasistatic C-V Meter
Refractometer
Semiconductor Characterization Device


Laboratories

R&D Training and Measurement Center

Electrical, Magnetic and Optical Properties Measurement Laboratory(EMOL)

Atomic Force Microscope
Barkhausen-Noise Analysis System
Color Spectrophotometer
Digital Multimeters
Electrical and Magnetic Properties Measurement System
Impedance Analyzer
Nanovolt, Micro-Ohm Meter
Oscilloscope
Quasistatic C-V Meter
Refractometer
Semiconductor Characterization Device


Laboratories

Share
Tweet
  • English
  • Türkçe
Listen


Instrument:
 Keithley 4200-SCS

The device, which is used to determine the current-voltage (I-V) properties of semiconductor materials and electronic devices such as diodes and transistors made from these materials, has real-time graphical presentation with the interface unit working under the windows operating system.

Applications

  • Semiconductor circuit elements
  • Resistive or capacitive MEMS devices
  • Optoelectronic circuit elements
  • Materials research
  • Electro-chemical researches

Sample Requirements

  • Sample connections should be prepared in accordance with existing junction boxes.
  • Photosensitive samples should be large enough to fit inside existing boxes; or it should be prepared with light insulation.

Merkezi Laboratuvar ARGE Eğitim Ölçme Merkezi Üniversiteler Mahallesi, Dumlupınar Bulvarı No:1, 06800 Çankaya/Ankara © ORTA DOĞU TEKNİK ÜNİVERSİTESİ ANKARA KAMPUSU