Instrument: JXA - 8230

The JXA-8230 Electron Probe Microanalyzer measures the energy and wavelengths of characteristic x-rays by sending a beam of electrons to the sample. It also has the ability to perform qualitative and full quantitative analysis.

Specifications

Element Measurement Range: B(5) to U(92)

Resolution (SEI): 6nm

Magnification : 40x to 300.000x

The quasistatic C-V meter measures the quasistatic capacitance of metal-insulator-semiconductor circuit elements (MIS) as a function of applied voltage (C-V). It uses the load-voltage (Q-V) technique during measurement.

Instrument: Keithley 595

This device also has the ability to make current-voltage (I-V) measurements.

Specifications

Instrument: Keithley 4200-SCS

The device, which is used to determine the current-voltage (I-V) properties of semiconductor materials and electronic devices such as diodes and transistors made from these materials, has real-time graphical presentation with the interface unit working under the windows operating system.

Applications

Instrument: Datacolor Mercury 2000

The hand-held spectrophotometer can make fast and precise reflection measurements.

Specifications

• Light source: Pulsed Xenon
• Spectral range: 400-700nm
• Effective bandwidth/resolution: 10nm/2nm
• Measuring range: 0 to 200% reflectance

Sample Requirements

Instrument: Schimidt+Haensch ATR W2

The automatic microprocessor controlled critical angle refractometer is designed to measure the refractive index of liquids regardless of opacity, viscosity and colour.

Specifications

Instrument: AGILENT 54642A

500 MHz, 2 channel.

Specifications

• 500MHz, 2GSa/s
• High resolution display
• 8MB signal storage memory
• Standard Integrated floppy drive, RS-232, and parallel connection

The impedance analyzer is used for precise impedance measurement and analysis of electronic components and circuits.

Instrument: AGILENT 4294A

Specifications