High Resolution Transmission Electron Microscope (RTEM)
Submitted by oerisen on 22 November 2021 - 12:27pmTRANSMISSION ELECTRON MICROSCOPY
Transmission Electron Microscope (TEM) is a distinct tool in materials characterization to determine the crystal structures and microstructures of materials by use of simultaneous diffraction and imaging techniques. In other words, TEM is the only tool to get both crystallographic and morphological information of materials from a region of few nanometers at magnifications up to million times.
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